Please use this identifier to cite or link to this item: http://www.repositorio.cdtn.br:8080/jspui/handle/123456789/518
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dc.contributor.authorMartins, Maximiliano Delany-
dc.contributor.authorAndrade, Leandro Hostalácio Freire de-
dc.contributor.authorGastelois, Pedro Lana-
dc.contributor.authorMacedo, Waldemar Augusto de Almeida-
dc.date.accessioned2016-08-29T18:47:36Z-
dc.date.available31-8-2010-
dc.date.available2016-08-29T18:47:36Z-
dc.date.issued2001-
dc.identifier.issnISSN 00218979-
dc.identifier.urihttp://www.repositorio.cdtn.br:8080/jspui/handle/123456789/518-
dc.description.abstractWe present experimental results on the growth and structure of Fe overlayers deposited on Cu84Al16(100) and discuss the correlation between the structural and magnetic properties of this system. Fe films 1-6 monolayers (ML) thick were grown under molecular beam epitaxy conditions onto the clean substrate at 160 K. Electron diffraction was applied to investigate the structure of the Fe films. The magnetic properties were investigated in situ by surface magneto-optical Kerr effect in the longitudinal geometry. Our results show that the onset of in-plane ferromagnetism around 3.5 ML of Fe coincides with structural changes that suggest a transformation within the Fe films from a fcc-like (100) to a bcc-like (110) structure with increasing Fe thickness, starting from 2.5 ML.-
dc.language.isoInglês-
dc.rightsL-
dc.subjectThin films-
dc.subjectiron-
dc.subjectmagnetic properties-
dc.titleGrowth structure and magnetic properties of Fe monolayers on Cu84Al16(100)-
dc.typeArtigo Periódico-
dc.creator.affiliationCentro de Desenvolvimento da Tecnologia Nuclear/CDTN, Belo Horizonte, MG, Brasil-
dc.creator.affiliationCentro de Desenvolvimento da Tecnologia Nuclear/CDTN, Belo Horizonte, MG, Brasil-
dc.creator.affiliationCentro de Desenvolvimento da Tecnologia Nulcear/CDTN, Belo Horizonte, MG, Brsil-
dc.creator.affiliationCentro de Desenvolvimento da Tecnologia Nuclear,CDTN, Belo Horizonte, MG, Brasil-
dc.identifier.fasciculo11-
dc.identifier.vol89-
dc.identifier.extentp. 6680-
dc.title.journalJournal of Applied Physics New York-
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